▪ High resolution throughout the entire field of view ▪ High NA, high contrast, and very low distortion ▪ All models are available with uniform coaxial illumination functionality as an option ▪ Most models are compatible with 2/3" or smaller CCD elements and support mega pixel CCDs, 1.3 mega pixels or greater
Surface inspection such as silicon wafers and machine components
Component recognition and inspection
Model Description
Specifications
Spec
MML4-HR65D-VI
Coaxial Illumination
-
Magnification
4.00±5%
WD (mm)
65
Resolution (μm)
3.0-13.3
Depth of Field (mm)
0.09-0.53
NA
0.112
Effective Fno
17.90-79.20
Distortion (%)
0.005
Weight (g)
95
Largest Compatible Sensor
2/3"
Mount
C Mount
* Resolution values indicate the theoretical resolution at a wavelength of 550nm. * Depth of field is calculated assuming a horizontal 240TV resolution using a 1/2 CCD camera. (Permissible circle of confusion on the image-formation side: 40μm)
External View
Contact Information
MORITEX North America, Inc.
Add：20380 Town Center Lane, Suite 215 Cupertino, CA 95014 USA.
