▪ Highest image quality of the MML Series designed for use with 5 megapixel, 3.45 μm element sensors ▪ WD 110 mm lineup focuses on large FOV applications with magnification of 0.14× and 0.3×(magnification depends on model) ▪ All models include uniform coaxial illumination functionality option ▪ Features an internal reflection light-scattering design and noise reduction filter for hot spot reduction ▪ Very low distortion
Surface inspection such as silicon wafers and machine components
Metrology and gauging
Model Description
Specifications
Spec
MML04-HR65-5M
Magnification
0.4
O/I(mm)
210.7
WD (mm)
65.1
Resolution (μm)
12.6
Depth of Field (mm)
3.75
NA
0.027
Effective Fno
7.5
Distortion (%)
≤-0.01
IF(mm)
11
* Resolution values indicate the theoretical resolution at a wavelength of 550nm. * Depth of field is calculated assuming a horizontal 240TV resolution using a 1/2 CCD camera. (Permissible circle of confusion on the image-formation side: 40μm)
External View
Contact Information
MORITEX North America, Inc.
Add：20380 Town Center Lane, Suite 215 Cupertino, CA 95014 USA.
